During the CIML Meeting, a Round Table will be held on
Wednesday 28 October in the morning; the theme will be "Metrological
The work being conducted in several Technical Committees
and Subcommittees addresses a number of fundamental legal metrology concepts
for which countries have developed different approaches.
The following OIML Publications are currently under revision:
- D 1 "Elements for a Law on Metrology", in
- D 3 "Legal qualification of measuring instruments",
in TC 3/SC 1;
- D 16 "Principles of assurance of metrological
control", in TC 3/SC 2;
- D 19 "Pattern evaluation and pattern approval",
in TC 3/SC 1;
- D 20 "Initial and subsequent verification of measuring
instruments and processes", in TC 3/SC 1.
Other work items have also started or are under consideration
related to the use of quality system certification, statistical control,
It is proposed that this Round Table be the occasion to
have presentations and discussions on fundamental issues of legal metrology
that are raised in particular in countries that are revising their law
on metrology and reorganizing their legal metrology regulations and infrastructure.
The themes which will be examined in this Round Table
are the following:
- Total systems approach to metrological control: should
measurements be regulated rather than measuring instruments?
- Metrological control in the future:
- moving the center of gravity from pre-market to post market control,
- may the different operations be carried out independently (for example
type evaluation and production evaluation)?
- Delegation of certain operations to private bodies
versus keeping them in state or state-run bodies, discussion of current
systems of in-service metrological control, possibilities of accepting
first part conformity evaluations, test results and/or declarations
of conformity (manufacturers, repairers, etc.).
- How to maintain a satisfactory level of knowledge
of and control over the actual overall quality of instruments in service?
- Meaning of MPEs at different stages of the life of
an instrument: design stage, production stage, before/after first installation,
at inspection, in service, after repair; use of uncertainty evaluation
in these cases.
Several Members or experts will give presentations on
these issues, and the floor will then be opened up for comments from delegates
in order to exchange views and to draw up, if possible, some consensus
orientations for the work of the various TCs/SCs in charge of these matters.