During the CIML Meeting, a Round Table will be held on Wednesday 28 October in the morning; the theme will be "Metrological Control".

The work being conducted in several Technical Committees and Subcommittees addresses a number of fundamental legal metrology concepts for which countries have developed different approaches.

The following OIML Publications are currently under revision:

• D 1 "Elements for a Law on Metrology", in TC 3;
  
• D 3 "Legal qualification of measuring instruments", in TC 3/SC 1;
  
• D 16 "Principles of assurance of metrological control", in TC 3/SC 2;
  
• D 19 "Pattern evaluation and pattern approval", in TC 3/SC 1;
  
• D 20 "Initial and subsequent verification of measuring instruments and processes", in TC 3/SC 1.
  

Other work items have also started or are under consideration related to the use of quality system certification, statistical control, sealings, etc.

It is proposed that this Round Table be the occasion to have presentations and discussions on fundamental issues of legal metrology that are raised in particular in countries that are revising their law on metrology and reorganizing their legal metrology regulations and infrastructure.

The themes which will be examined in this Round Table are the following:

1. Total systems approach to metrological control: should measurements be regulated rather than measuring instruments?
   
2. Metrological control in the future:
   - moving the center of gravity from pre-market to post market control,
   - may the different operations be carried out independently (for example type evaluation and production evaluation)?
   
3. Delegation of certain operations to private bodies versus keeping them in state or state-run bodies, discussion of current systems of in-service metrological control, possibilities of accepting first part conformity evaluations, test results and/or declarations of conformity (manufacturers, repairers, etc.).
   
4. How to maintain a satisfactory level of knowledge of and control over the actual overall quality of instruments in service?
   
5. Meaning of MPEs at different stages of the life of an instrument: design stage, production stage, before/after first installation, at inspection, in service, after repair; use of uncertainty evaluation in these cases.
   

Several Members or experts will give presentations on these issues, and the floor will then be opened up for comments from delegates in order to exchange views and to draw up, if possible, some consensus orientations for the work of the various TCs/SCs in charge of these matters.